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Principles and Methodology for the Simultaneous Determination of Thickness and Dielectric Constant of Coatings With Capacitance Measurements

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2 Author(s)
A. Guadarrama-Santana ; Univ. Nacional Autonoma de Mexico, Coyoacan ; A. Garcia-Valenzuela

We propose a new methodology to measure both the dielectric constant and thickness of dielectric coatings on a flat conducting substrate from two capacitance measurements. We discuss the principles of the method and demonstrate its feasibility using 2-D numerical simulations. We present a proof of principles experiment confirming the viability of the method in practice. Finally, we propose and analyze a multisphere electrode geometry

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:56 ,  Issue: 1 )