Fast Modeling and Optimization of Active Millimeter Wave Imaging Systems

This paper presents a simplified 2D calculation method based on Huygens' principle for active millimeter wave imaging systems. Although limited in its ability to accurately treat 3D systems, the method is a powerful tool for first order system optimization. We show in this paper how image aberrations such as speckle and glint can be studied and how image enh ancing techniques can be studied with very little computational resources