Cart (Loading....) | Create Account
Close category search window
 

Microwave Power Measurements Employing Electron Beam Techniques

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Thomas, H.A. ; General Atomic Div., General Dynamics Corp., San Diego, Calif. Formerly with the Radio Standards Div., Boulder, Colo., Labs. of Natl. Bureau of Standards

A new electron beam technique for measuring microwave power flow, either cw or pulse, in waveguides is described. This technique consists of accelerating an electron beam transversely through an evacuated section of waveguide carrying power in the TE10 mode. The transit time of the electrons is adjusted to a value which gives maximum interaction of the field in the guide with the electrons, i.e., electrons gain maximum energy. The energy gained by the electrons is measured by means of a dc stopping potential which can be related to the field. Power is then calculated from the Poynting vector. The instrument takes the form of a sealed-off vacuum tube having a short section of waveguide as part of the tube. The ends of the waveguide may be sealed using known window techniques. The theory for the ideal case is presented and then means of correcting for the various perturbations present in an actual tube are discussed. The theory and the corrections are verified by experiment. The technique appears to have definite value for monitoring or measuring high- and medium-level cw or pulse-power flow. Theoretically the device is self-calibrating and therefore might make a good primary standard. Its suitability as a primary standard is under further investigation.

Published in:

Proceedings of the IRE  (Volume:45 ,  Issue: 2 )

Date of Publication:

Feb. 1957

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.