Quantitative Measurements of Memory Effects in Wideband RF Power Amplifiers Driven by Modulated Signals

This letter proposes a novel metric to measure quantitatively the electrical memory effects in wideband power amplifiers (PAs) fed with modulated signals. With the proposed memory effect metrics, the intensity of the electrical memory effects for different PAs, under a variety of the excitation modulated signals, can be quantitatively defined. The examples given in this letter illustrate the effectiveness of this definition in measuring the electrical memory effects