Cart (Loading....) | Create Account
Close category search window
 

Progress in the Development of Post-Acceleration and Electrostatic Deflection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Schlesinger, Kurt ; TV Res. Dept., Motorola, Inc., Chicago, Illinois

Electrostatic deflection from a common center is possible by the use of electrostatic yokes, or Deflectrons. These consist of a 4-terminal pattern, printed on the inside of glass cylinders or cones. An analysis of the pattern geometry is presented which gives simple expressions for deflection factor of electrostatic yokes. The theory also accounts for a small residual noncircularity of scan, and gives clues as to its correction. Equipment to test tube performance is described, including ultraviolet mapping and electronic detection of the axis. The most suitable type of post-accelerator for use with Deflectrons employs a long drift space, bounded by a metallic mask, and confines the high gradient to a narrow region close to the screen. It is shown that this mask intensifier suffers from secondary emission. This effect can be effectively suppressed by an insulating coating of the first surface of the mask, while connecting the support metal to a lower potential than the drift space. The resulting double layer of charges prevents the escape of secondaries towards the screen. This barrier-mask intensifier permits post-acceleration ratios of 10 to 1 without loss of deflection.

Published in:

Proceedings of the IRE  (Volume:44 ,  Issue: 5 )

Date of Publication:

May 1956

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.