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Negative Resistance Regions in the Collector Characteristics of the Point-Contact Transistor

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1 Author(s)
Miller, L.E. ; Bell Tel. Labs., Inc., Allentown, Pa.

The negative resistance regions in the active portion of the point-contact collector characteristics are characterized in terms of three unique types of anomalies in the current multiplication properties of the device. While the interaction of the ¿ anomalies and the associated circuitry result in a measuring circuit instability, the negative resistances are true device properties which are attributable to variations in the collection efficiency of the reverse biased collector junction.

Published in:

Proceedings of the IRE  (Volume:44 ,  Issue: 1 )

Date of Publication:

Jan. 1956

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