Cart (Loading....) | Create Account
Close category search window

The Theory and Application of the Radiation Mutual-Coupling Factor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Blasi, E.A. ; Research and Development Labs., Hughes Aircraft Company, Culver City, Calif.

The network equations for determining mutual impedance between a pair of radiating elements are analyzed and a new equation is determined in which the mutual impedance is expressed in terms of the self-impedances of the radiating elements and a new parameter designated as the radiation mutual-coupling factor Mr. A technique is outlined whereby this new parameter can be isolated and accurately measured despite the presence of discontinuities at the base of the radiating element to which a slotted line is connected. The technique is demonstrated for the case of a pair of identical quarter-wave monopoles and the results compared with the theroetical values interpolated from King's approximate second-order solution. The technique is then applied to the case of a pair of identical axial mode helical radiators.

Published in:

Proceedings of the IRE  (Volume:42 ,  Issue: 7 )

Date of Publication:

July 1954

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.