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This paper considers stability problems encountered in measuring parameters of vhf point contact transistors. It develops the high frequency modification of the low frequency requirement for stability. It then considers instability which may be caused by negative resistance collector regions. This type of instability is responsible for breaks or discontinuities which have been observed in the static characteristics of some point contact transistors. Simple stabilized circuits for static characteristic curve tracers, using either oscilloscopic or X-Y recorder presentation, are given.