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Microwave Measurements on Metallic Delay Media

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1 Author(s)
Seymour B. Cohn ; Head of the Microwave Group of the Engineering Division, Stanford Research Institute. Prior to February, 1953, with the Sperry Gyroscope Co., as Research Engineer in the Microwave Instruments and Components Department

This paper presents rf index-of-refraction data for metallic delay-lens media containing square and circular obstacles. The equipment used in measuring this data is described, and the necessary correction formulas are given. The test specimens consisted of alternate layers of polyfoam spacers and thin polystyrene sheets imprinted with conducting obstacles. The data may be extended readily to other techniques of fabrication.

Published in:

Proceedings of the IRE  (Volume:41 ,  Issue: 9 )