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Artificial Dielectrics for Microwaves

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1 Author(s)
Sharpless, W.M. ; Bell Telephone Laboratories, Inc., Holmdel, N.J.

This paper presents a procedure for measuring the dielectric properties of metal-loaded artificial dielectrics in the microwave region by the use of the short-circuited line method. Formulas, based on transmission-line theory, are included and serve as guides in predicting the approximate dielectric properties of certain loading configurations.

Published in:

Proceedings of the IRE  (Volume:39 ,  Issue: 11 )