By Topic

Designing in reliability with standard cells

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Brown, T.H. ; NCR Microelectron., Colorado Springs, CO, USA ; Locke, D.G. ; Daughton, W.

The authors show the advantages of using generic standard-cell data in qualifying a military product. They describe the proposed methodology used in qualifying ASIC (application-specific integrated circuit) standard-cell devices for military use. Reliability results of using standard cells and recommendations for qualifying military standard-cell products are presented. It is noted that this new approach to qualifying ASIC standard-cell library devices for a military environment allows new designs to be introduced at a minimal cost and insures reliability at the same time

Published in:

Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National

Date of Conference:

22-26 May 1989