Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Diagnosis of conducted interference with discrimination network

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
See Kye Yak ; Sch. of Electr. & Electron. Eng., Nanyang Technol. Univt., Singapore ; Ng Chee Sum

Power supply circuit testing for compliance to conducted emission limits utilizes a line impedance stabilization network (LISN) and is usually carried out during the final stage of the product design. However, the LISN measures only the total contribution of common-mode (CM) and differential-mode (DM) emissions in the live or neutral line. In EMI filter design, it is always desirable to be able to determine whether the differential- or the common-mode component is dominant in order to pin-point the effective element of the filter to be changed to reduce the total emission. This, in essence, minimizes the trial-and-error guess work in selecting the proper components of the filter and cuts down on design time. This paper touches on the conventional way for measuring total conducted noise emissions of a product and how the CM/DM discrimination network (CM/DM DN) can be used as an effective diagnostic tool for the modification of power supply filters to reduce conducted noise emissions

Published in:

Power Electronics and Drive Systems, 1995., Proceedings of 1995 International Conference on

Date of Conference:

21-24 Feb 1995