By Topic

Concave and Convex Area on Planar Curve for Shape Defect Detection and Recognition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Musa Mokji ; Faculty of Electrical Engineering, University of Technology Malaysia, Malaysia. musa@fke.utm.my

A shape representation based on concave and convex area along a closed curve is presented. Curvature estimation is done to the input curve and searched for its critical points. Splitting the critical points into concave and convex critical points, the concave and convex area is computed. This technique is tested on shape defect detection of starfruit and also to shape recognition. In the first case, defect is measured with concave energy and obtained a stable measure, which is proportional with the defect. In shape recognition, starfruit's stem is identified to remove it from the starfruit shape, as it will contribute to false computation in defect measurement

Published in:

2006 IEEE International Symposium on Signal Processing and Information Technology

Date of Conference:

Aug. 2006