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Limiting Upset Cross Sections of SEU Hardened SOI SRAMs

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9 Author(s)
Liu, M.S. ; Honeywell Defense & Space Electron. Syst., Plymouth, MN ; Liu, H.Y. ; Brewster, N. ; Nelson, D.
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This paper discusses the practical limits of proton and heavy ion induced single event upset cross sections in SEU hardened deep submicron SOI SRAMs. Non-conventional "double-hit" mechanisms are hypothesized to explain test results

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Nuclear Science, IEEE Transactions on  (Volume:53 ,  Issue: 6 )