Referenced Items are not available for this document.
We illustrate inherent subtle differences between Single Event Transients generated by above bandgap picosecond lasers and MeV heavy ions in a Si junction by comparing transient currents collected on a p-i-n structure using an MeV ion microbeam and picosecond laser with variable spot size. Differences between the ion and laser results are discussed and Synopsis Technology CAD simulations are employed to examine differences in plasma dynamics leading to the observed transient current dependence on initial track conditions
Published in:
Nuclear Science, IEEE Transactions on
(Volume:53
,
Issue:
6
)
Date of Publication: Dec. 2006
- Page(s):
- 3312 - 3320
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 9257739
- Digital Object Identifier :
- 10.1109/TNS.2006.886007
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 19 December 2006
- Issue Date :
- Dec. 2006
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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