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Single-Event Transients in Bipolar Linear Integrated Circuits

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2 Author(s)
Buchner, S. ; QSS Group Inc, Lanham, MD ; McMorrow, D.

Single-event transients (SETs) in linear integrated circuits have caused anomalies in a number of spacecraft. The consequences of these anomalies have spurred efforts to better understand SETs, including the mechanisms responsible for their generation, the best approaches for testing, how data should be analyzed and presented, and approaches for mitigation

Published in:

Nuclear Science, IEEE Transactions on  (Volume:53 ,  Issue: 6 )