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Electrical characterization of Nb/Al-oxide/Nb Josephson junctions with high critical current densities

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4 Author(s)

Transport in Nb/AlO/sub x//Nb junctions involves two parallel channels, barrier defects (pinholes) with sub-nanometer dimensions and nearly-ideal tunneling regions. We fit junction characteristics using only a single parameter, the ratio of the normal state conductances of these current paths. Our barrier model accounts for the excellent Josephson behavior and highly non-ideal quasiparticle characteristics of junctions with critical current densities as high as 4 mA//spl mu/m/sup 2/. It appears to be quite generally applicable to tunnel junctions.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:5 ,  Issue: 2 )

Date of Publication:

June 1995

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