Application of Josephson edge type junctions with a PrBa/sub 2/Cu/sub 3/O/sub 7/ barrier prepared with Br-ethanol etching or cleaning

The technique of the edge preparation for multilayer Josephson edge type junctions on the basis of c-axis oriented YBa/sub 2/Cu/sub 3/O/sub 7/ thin films with the help of etching in Br-ethanol solution was improved. Microwave induced Shapiro steps, Josephson radiation, and characteristics of dc-SQUIDs were investigated. The developed technique prevents the junctions and device properties from degradation due to aging or thermal cycling.<
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