Cart (Loading....) | Create Account
Close category search window
 

Ferroelectric thin film characterization using superconducting microstrip resonators

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Galt, D. ; Dept. of Phys., Colorado Univ., Boulder, CO, USA ; Price, J.C. ; Beall, J.A. ; Harvey, T.E.

We describe a novel technique for characterizing the dielectric response of ferroelectric thin films at microwave frequencies. The method involves a microstrip resonator which incorporates a ferroelectric capacitor at its center. To demonstrate this method rye have fabricated a superconducting microstrip resonator from a laser-ablated YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// (YBCO) film on a LaAlO/sub 3/ (LAO) substrate with a SrTiO/sub 3/ (STO) capacitor at its center. We report the observed dielectric behavior of the STO laser ablated film as a function of bias at liquid He and N/sub 2/ temperatures and at high and low frequencies. It is observed that the electrically tunable dielectric constant of the STO film is roughly independent of frequency up to 20 GHz (especially at high bias). The loss tangent of the STO/LAO capacitor decreases with increasing bias and is apparently independent of frequency between 6 and 20 GHz.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:5 ,  Issue: 2 )

Date of Publication:

June 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.