Cart (Loading....) | Create Account
Close category search window
 

Eddy current evaluation of airframes using refrigerated SQUIDs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Podney, W.N. ; SQM Technol. Inc., La Jolla, CA, USA

A superconductive quantum interference device, RF SQUID, fixed to the cold pad of a Heliplex HS-4 refrigerator shows a baseline noise of 1.6/spl times/10/sup -4/ flux quanta in a one hertz bandwidth at frequencies above about 25 Hz. The refrigerator adds noise below 25 Hz. Remote pickup loops couple flux to the SQUID through a cryogenic umbilical, 500 mm long, attached to the cold pad. It enables scanning a 100/spl times/100 millimeter section of airframe without moving the expander, which connects to compressors through flexible gas lines 3 m long. Thermal conduction through copper braiding in the umbilical keeps pickup loops at 5.5 K, 3 mm from an airframe at ambient temperature. Drive currents of a few amperes, oscillating at one to three hundred Hertz enable identifying 5 to 10 percent material loss through 10 to 15 mm of aluminium.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:5 ,  Issue: 2 )

Date of Publication:

June 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.