Cart (Loading....) | Create Account
Close category search window

Critical current density distribution and magnetic flux states in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// bicrystal grain boundary Josephson junctions

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Fischer, G.M. ; Phys. Inst., Tubingen Univ., Germany ; Mayer, B. ; Schulze, H. ; Gross, R.

We have studied the spatial homogeneity of the critical current density J/sub c/ and static magnetic flux states in YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// bicrystal grain boundary Josephson junctions (GBJs) using Low Temperature Scanning Electron Microscopy (LTSEM). By LTSEM the J/sub c/ distribution and the static magnetic flux states in the GBJs could be imaged with a resolution of less than 1 /spl mu/m. Varying the applied magnetic field B the different magnetic flux states with up to more than 15 vortices in the GBJ could be observed. The spatial variation of the measured LTSEM voltage signal agrees well with the theoretically expected signal according to the sinusoidal modulation of the maximum Josephson current density by an external magnetic field. The LTSEM analysis clearly demonstrates that the spatial variation of J/sub c/ along the grain boundary is less than about 30% on the length scale of the spatial resolution of the LTSEM technique.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:5 ,  Issue: 2 )

Date of Publication:

June 1995

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.