By Topic

Research of Correspondence Points Matching on Binocular Stereo Vision Measurement System Based on Wavelet

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Bin Liu ; Dept. of Electr. Eng., Yanshan Univ., Qinhuangdao ; Hai-Bin Gao ; Qiang Zhang

A method is presented to solve correspondence points matching on binocular stereo vision measurement system. It is based on that the multi-scale zero-crossings of wavelet transform can obtain the locations of the signal sharp variation points at scales for a particular class of wavelets. After studying the physical model of binocular stereo vision measurement system, a coarse to fine matching algorithm is applied to solve the problem of correspondence points matching. First we match the bigger scale zero-crossings, compute the disparity and then match the smaller scale zero-crossings under the restriction of disparity using the distance information. Thus the complexity of correspondence points matching is decreased and the matching mistake is reduced. The thickness of cement clinker in the cooler is measured using this method. The experiment result indicates that the distributing status of cement clinker thickness can be calculated accurately. Error measured in this method is lower than that measured in the old method

Published in:

Machine Learning and Cybernetics, 2006 International Conference on

Date of Conference:

13-16 Aug. 2006