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Microstructures and properties of laser-ablated epitaxial Y-Ba-Cu-O thin films for electronic device applications

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7 Author(s)
Yeadon, M. ; Dept. of Metall. & Mater., Birmingham Univ., UK ; Aindow, M. ; Wellhofer, F. ; Abell, J.S.
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A study of the microstructures and properties of a series of laser-ablated films of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// on [001] MgO with thicknesses of between 800 and 1900 nm is presented. Transmission electron microscopy has been used to reveal the orientation and defect microstructures of the films and it is shown that both the orientation and threading dislocation content change with deposit thickness. Measurements of surface resistance show no clear correlation with thickness whereas critical current density appears to decrease with increasing thickness. Possible relationships between the microstructures and properties are discussed.<>

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:5 ,  Issue: 2 )

Date of Publication:

June 1995

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