By Topic

Polygonization of volumetric reconstructions from silhouettes

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Montenegro, A.A. ; Departamento de Informatica e Ciencia da Computagao, Univ. do Estado do Rio de Janeiro ; Velho, L. ; Carvalho, P.C.P. ; Sossai, J.

In this work we propose a method for the polygonization of octree-based reconstructions by dual contouring. Dual contouring is an adaptive method for determining contiguous polygonal meshes from signed octrees. It determines the positioning of the vertices of the mesh by minimizing a quadratic error expressed in terms of hermitian data. In order to apply dual contouring on volumetric reconstruction from silhouettes we devised a method that is able to determine the discrete topology of the contour in relation to the octree cells, as well as the hermitian data corresponding to the intersections and normals of conic volumes whose intersection approximates a structure known as visual hull. Due to the discrete and extremely noisy nature of the data used in the reconstruction we had to devise a different criterion for mesh simplification that applies topological consistency tests only when the geometric error measure is beyond a given tolerance. We present results of the application of the proposed method in the extraction of a mesh corresponding to the surface of objects of a real scene

Published in:

Computer Graphics and Image Processing, 2006. SIBGRAPI '06. 19th Brazilian Symposium on

Date of Conference:

8-11 Oct. 2006