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Low-cost and Universal Secure Scan: a Design- Architecture for Crypto Chips

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3 Author(s)
Gomulkiewicz, M. ; Inst. of Math. & Comput. Sci., Wroclaw Univ. of Technol. ; Nikodem, M. ; Tomczak, T.

Scan based design-for-test is a powerful testing scheme, but it can be used to retrieve secrets stored inside a crypto device. In this paper, we propose a novel scan based DFT architecture called secure scan that maintains the high test quality without compromising the security. Moreover our proposition is universal and can be easily implemented as an extension of the standard scan chain architecture. Apart from presenting our proposal we analyse its implementation complexity, test's efficiency impact and gained security level

Published in:

Dependability of Computer Systems, 2006. DepCos-RELCOMEX '06. International Conference on

Date of Conference:

25-27 May 2006

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