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The evolution of built-in test for an electrical power generating system (EPGS)

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2 Author(s)
Dailey, S.J. ; Sundstrand Adv. Technol. Group, Rockford, IL, USA ; Carpenter, W.F.

The authors review the history of the EPGS built-in test (BIT), types of BIT, the lessons learned from EPGS BIT evolution, and BIT effectiveness. While earlier fault isolation capabilities relied on analog-based built-in-test (BIT) systems, current designs now use microprocessor-based BIT systems or a combination of the two. It is noted that locations of readouts and types of codes/information play an important part in BIT utilization

Published in:

Aerospace and Electronics Conference, 1989. NAECON 1989., Proceedings of the IEEE 1989 National

Date of Conference:

22-26 May 1989