Cart (Loading....) | Create Account
Close category search window
 

Bicoherence Used to Predict Lucky Regions in Turbulence Affected Surveillance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wen, Z. ; The University of New South Wales, Australia ; Fraser, D. ; Lambert, A.

Long-distance surveillance is an emerging technology which attracts more and more attention from researchers in different areas, particularly for security applications. One of the major challenges of such technology is how to remove the effect due to atmospheric turbulence to get highresolution images. A common practice is to take shortexposure images of the target so that the effect of atmospheric turbulence is frozen, and then the raw images are post-processed to estimate a good quality image (speckle imaging techniques). A new lucky region approach based on such techniques is presented in this paper. The lucky regions are extracted through bicoherence analysis, and the final output image is obtained by post-processing (dewarping and blind deconvolving) the lucky regions. The new technique allows for automatic identification and extraction of lucky regions, and can be easily implemented. Realworld results show that the algorithm is promising.

Published in:

Video and Signal Based Surveillance, 2006. AVSS '06. IEEE International Conference on

Date of Conference:

Nov. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.