Cart (Loading....) | Create Account
Close category search window
 

Theoretical Justification of Space-Mapping-Based Modeling Utilizing a Database and On-Demand Parameter Extraction

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Koziel, S. ; Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont. ; Bandler, J.W. ; Madsen, K.

We present a theoretical justification of a recently introduced surrogate modeling methodology based on space mapping (SM) that relies on an available database and on-demand parameter extraction. Fine-model data, the so-called base set, is assumed available in the region of interest. To evaluate the surrogate, we perform parameter extraction with weighting coefficients dependent on the distance between the point of interest and base points. We provide theoretical results showing that the new methodology can assure any accuracy that is required (provided the base set is dense enough), which is not the case for our benchmark SM modeling methodology. Illustrative examples emphasizing differences between modeling methodologies are provided

Published in:

Microwave Theory and Techniques, IEEE Transactions on  (Volume:54 ,  Issue: 12 )

Date of Publication:

Dec. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.