By Topic

Calibrated Free-Space Microwave Measurements With an Ultrawideband Reflectometer-Antenna System

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zhao, M. ; Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI ; Shea, J.D. ; Hagness, S.C. ; Van Der Weide, D.W.

We present a 3-12 GHz compact mixer-based reflectometer (CMR) and horn antenna system, and demonstrate its use in detecting backscatter signals with a free space calibration procedure. We evaluate the frequency-domain performance of the CMR-antenna system for measuring the complex reflection coefficient of a dielectric slab and compare it with that of a commercial vector network analyzer (VNA)-antenna setup. Time-domain responses are also investigated, and show the effectiveness of this calibration method. This low-cost, compact system eliminates the need for traditional mechanical standards and a VNA, is effective in reducing reflection artifacts, and allows for flexibility in the placement of reference planes; thus it is well suited for array-based imaging applications

Published in:

Microwave and Wireless Components Letters, IEEE  (Volume:16 ,  Issue: 12 )