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Comments on "Postbreakdown Current in MOS Structures: Extraction of Parameters Using the Integral Difference Function Method

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1 Author(s)
Saralees Nadarajah ; Escola Tecnica Superior d'Enginyeria, Univ. Autonoma de Barcelona, Bellaterra

For original paper by E. Miranda see ibid. vol. 6, no. 2, p. 190-96, Jun. 2006

Published in:

IEEE Transactions on Device and Materials Reliability  (Volume:6 ,  Issue: 4 )