Cart (Loading....) | Create Account
Close category search window
 

Volumetric flow measured in a laminar jet phantom using a two-dimensional speckle tracking system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)

A two-dimensional speckle tracking system was used to measure volumetric flow rates in a free laminar jet in vitro. The system utilized the Sum-Absolute-Difference (SAD) pattern matching algorithm to track small speckle regions between successive pulse-echo acquisitions in order to determine 2D velocities. Velocity profiles were measured across the jet diameter at a transducer angle of 90° at six flow rates from 2-12 cm/s. The profiles were then integrated, assuming a circular cross-section, to compute the volumetric flow rates. Experimental volumetric flow rates exhibited excellent agreement with actual rates (best fit line: y=1.04x-0.043, R2>0.99), with a mean error of 3.5%. Results indicate that accurate volume flow estimates can he obtained at 90°, where current uni-dimensional Doppler instruments fail, in circular free laminar jets

Published in:

Ultrasonics Symposium, 1994. Proceedings., 1994 IEEE  (Volume:3 )

Date of Conference:

Oct. 31 1994-Nov. 3 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.