Cart (Loading....) | Create Account
Close category search window
 

A Multicriteria Approach to Data Summarization Using Concept Ontologies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yager, R.R. ; Machine Intelligence Inst., Iona Coll., New Rochelle, NY ; Petry, F.E.

This paper describes a conceptual and theoretical framework to allow better user control over data summarization for knowledge discovery. Basic to the approach is a measure of quality of summarization of data using categories provided by the hierarchical structure of concept ontology. This involves the modeling, using a fuzzy sets approach, of the four criteria implicit in a summarization imperative: minimum coverage, minimum relevance, succinctness, and usefulness. With these criteria modeled, a multicriteria approach is presented, using a decision function aggregating these criteria that provides an overall quality measure to guide the summarization of the data. The development of the theory is first presented for the simple case of a single attribute to clearly delineate the basic issues and approach and then extended to multiple attributes. Finally, approaches to provide a more user-oriented presentation of the summarized data are considered

Published in:

Fuzzy Systems, IEEE Transactions on  (Volume:14 ,  Issue: 6 )

Date of Publication:

Dec. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.