Cart (Loading....) | Create Account
Close category search window
 

Interactive Level-of-Detail Selection Using Image-Based Quality Metric for Large Volume Visualization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wang, C. ; Dept. of Comput. Sci. & Eng., Ohio State Univ., Columbus, OH ; Garcia, A. ; Han-Wei Shen

For large volume visualization, an image-based quality metric is difficult to incorporate for level-of-detail selection and rendering without sacrificing the interactivity. This is because it is usually time-consuming to update view-dependent information as well as to adjust to transfer function changes. In this paper, we introduce an image-based level-of-detail selection algorithm for interactive visualization of large volumetric data. The design of our quality metric is based on an efficient way to evaluate the contribution of multiresolution data blocks to the final image. To ensure real-time update of the quality metric and interactive level-of-detail decisions, we propose a summary table scheme in response to runtime transfer function changes and a GPU-based solution for visibility estimation. Experimental results on large scientific and medical data sets demonstrate the effectiveness and efficiency of our algorithm

Published in:

Visualization and Computer Graphics, IEEE Transactions on  (Volume:13 ,  Issue: 1 )

Date of Publication:

Jan.-Feb. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.