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Measurement-Based Non-Quasi-Static Large-Signal FET Model Using Artificial Neural Networks

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5 Author(s)
Jianjun Xu ; Agilent Technol. Inc., Santa Rosa, CA ; Gunyan, Daniel ; Iwamoto, M. ; Cognata, Alex
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A new measurement-based FET model is presented which combines non-quasi-static dynamics formulated with constitutive relations derived using adjoint and conventional artificial neural networks (ANN). The new model features smoother constitutive relations than spline-based methods while maintaining the non-quasi-static dynamics for accurate distortion simulations. Additionally, this work demonstrates, for the first time, the construction of an adjoint-trained ANN-based "high-frequency drain current" constitutive relation (accounting for dispersion due to traps and thermal effects in III-V FETs), along with drain and gate terminal charges from measured bias-dependent data. The model is implemented in Agilent ADS and validated with nonlinear measurements on a 0.25mum GaAs pHEMT device

Published in:

Microwave Symposium Digest, 2006. IEEE MTT-S International

Date of Conference:

11-16 June 2006