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Correction of errors owing to thermal elongation of high temperature coaxial probe for microwave permittivity measurement

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3 Author(s)
Arai, M. ; Dept. of Mater. Eng. & Mater. Design, Nottingham Univ., UK ; Binner, J.G.P. ; Cross, T.E.

A method for correcting errors owing to the thermal elongation of high temperature coaxial probe for microwave permittivity measurement has been developed. The method has been verified by measuring the open circuit permittivity of the probe which operates up to 1200°C

Published in:

Electronics Letters  (Volume:31 ,  Issue: 14 )