Cart (Loading....) | Create Account
Close category search window
 

High tuning coefficient whispering gallery modes in a sapphire dielectric resonator transducer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Peng, H. ; Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia ; Blair, D.G.

A sapphire dielectric resonator transducer utilizes high tuning coefficient whispering gallery modes in a double disk resonator. The high tuning coefficients and high Q-factors of the whispering gallery modes allow the transducer to achieve very high sensitivity for displacement measurements. In this report, we present an improved mode matching method which can determine the resonant frequencies of the whispering gallery modes in double cylindrical dielectric disk resonators with high accuracy. Two double sapphire disk resonators with different dimensions have been tested to verify the theory. The comparison of the theoretical and experimental results is described. The frequency tuning behaviour of the whispering gallery modes is investigated

Published in:

Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International

Date of Conference:

1-3 Jun 1994

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.