By Topic

Loss measurement and analysis of high-silica reflection bending optical waveguides

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Himeno, A. ; Electr. Commun. Labs., NTT, Ibaraki, Japan ; Terui, H. ; Kobayashi, M.

Bending loss of high-silica single-mode bending optical waveguides using a waveguide side-wall as a reflecting facet is described theoretically and experimentally as a function of the bending angle. Two types of bending waveguides, which have the reflecting facet exposed to the air coated with a metal film, are treated. The causes of bending loss are discussed in terms of los due to the Goos-Hanchen effect and the perpendicularity and roughness of the reflecting facet

Published in:

Lightwave Technology, Journal of  (Volume:6 ,  Issue: 1 )