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SPICE-simulation of nonlinear effects in field-effect-transistors caused by thermal power feedback

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3 Author(s)
Schurack, E. ; Inst. for Commun. Eng., Federal Armed Forces Univ. Munich, Neubiberg, Germany ; Latzel, T. ; Gottwald, A.

In order to evaluate the influence of the internal power-dependent-thermally-effected feedback in field-effect-transistors, a model for simulated program with IC emphasis (SPICE) simulation is proposed. It considers several variable temperature influences on transistor parameters, as well as a complex thermal network. Examples for both static and dynamic simulation are presented

Published in:

Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on

Date of Conference:

3-6 May 1993

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