SPICE-simulation of nonlinear effects in field-effect-transistors caused by thermal power feedback

In order to evaluate the influence of the internal power-dependent-thermally-effected feedback in field-effect-transistors, a model for simulated program with IC emphasis (SPICE) simulation is proposed. It considers several variable temperature influences on transistor parameters, as well as a complex thermal network. Examples for both static and dynamic simulation are presented.<
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