Cart (Loading....) | Create Account
Close category search window
 

Area and performance comparison of pipelined RISC processors implementing different precise interrupt methods

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chia-Jiu Wang ; Dept. of Electr. & Comput. Eng., Colorado Univ., Colorado Springs, CO, USA ; Emnett, F.

The paper presents a comparative study of circuit area and performance degradation among four pipelined RISC processors using different precise interrupt methods. The precise interrupt methods studied, include inorder completion, reorder buffer, history file and future file. The VHDL is used to model five machines at the register transfer level. The Synopsys design compiler is used to synthesize these machines as a netlist of CMOS logic gates, then gate counts are obtained. Based on our model architecture and benchmark programs, it shows that the history file method can achieve the highest performance and consume less silicon area than the reorder buffer method and the future file method

Published in:

Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on

Date of Conference:

3-6 Oct 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.