Cart (Loading....) | Create Account
Close category search window
 

Efficient diagnosis in algorithm-based fault tolerant multiprocessor systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Srinivasan, S. ; Dept. of Electr. Eng., Princeton Univ., NJ, USA ; Jha, N.K.

The conventional assumption that checks in an algorithm-based fault tolerant (ABFT) system can be invalidated due to aliasing of erroneous data elements has complicated the task of error detection and location. In this paper we show that aliasing is a very rare occurrence. We then present a simple polynomial-time diagnosis algorithm which takes advantage of this result to run much more efficiently compared to the conventional method of diagnosis. We introduce the concept of NC-detectability and NC-locatability to measure the fault tolerance of the system when check invalidation does not occur and show how to design systems with specified error detectability/NC-detectability and locatability/NC-locatability. For the data-check graphs designed using these methods, when aliasing does not occur, our diagnosis algorithm has a worst case complexity of O(s2n2log n), where s is the error locatability and n is the number of data elements in the system. We also consider the case where the processors which compute the checks themselves fail

Published in:

Computer Design: VLSI in Computers and Processors, 1993. ICCD '93. Proceedings., 1993 IEEE International Conference on

Date of Conference:

3-6 Oct 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.