Cart (Loading....) | Create Account
Close category search window

A comparison of deconvolution and windowed subtraction techniques for scatter compensation in SPECT

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yanch, J.C. ; Dept. of Phys., Inst. of Cancer Res. & R. Marsden Hospital, Sutton, UK ; Flower, M.A. ; Webb, S.

Three procedures for the removal of Compton-scattered data in SPECT by constrained deconvolution are presented. The first is a deconvolution of a 2-D measured PSRF containing scatter from a single reconstructed transaxial image; the second is a deconvolution of a 2-D measured point-source response function (PSRF) from each frame of projection data prior to reconstruction; the third involves deconvolution of a 3-D measured PSRF from a stack of reconstructed slices. Results of applying these procedures to data obtained from a phantom containing cold cylinders and to data from a cold spot-resolution phantom are presented and are shown to be superior to the results of correcting for scatter by scatter-window substraction. Both 3-D deconvolution from reconstructed images and 2-D deconvolution from projection data show major improvements in image contrast, resolution, and quantitation. Improvements are especially marked for small (1.0-3.0 cm) cold sources

Published in:

Medical Imaging, IEEE Transactions on  (Volume:7 ,  Issue: 1 )

Date of Publication:

Mar 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.