By Topic

Combinational and sequential logic optimization by redundancy addition and removal

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Entrena, L.A. ; TGI, Madrid, Spain ; Kwang-Ting Cheng

This paper presents a method for multilevel logic optimization for combinational and synchronous sequential circuits. The circuits are optimized through iterative addition and removal of redundancies. Adding redundant wires to a circuit may cause one or many existing irredundant wires and/or gates to become redundant. If the amount of added redundancies is less than the amount of created redundancies, the transformation of adding followed by removing redundancies will result in a smaller circuit. Based upon the Automatic Test Pattern Generation (ATPG) techniques, the proposed method can efficiently identify those wires for addition that would create more redundancies elsewhere in the network. Experiments on ISCAS-85 combinational benchmark circuits show that best results are obtained for most of them. For sequential circuits, experimental results on MCNC FSM benchmarks and ISCAS-89 sequential benchmark circuits show that a significant amount of area reduction can be achieved beyond combinational optimization and sequential redundancy removal

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:14 ,  Issue: 7 )