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On image analysis by the methods of moments

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2 Author(s)
Teh, C.-H. ; Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA ; Chin, R.T.

Various types of moments have been used to recognize image patterns in a number of applications. A number of moments are evaluated and some fundamental questions are addressed, such as image-representation ability, noise sensitivity, and information redundancy. Moments considered include regular moments, Legendre moments, Zernike moments, pseudo-Zernike moments, rotational moments, and complex moments. Properties of these moments are examined in detail and the interrelationships among them are discussed. Both theoretical and experimental results are presented

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:10 ,  Issue: 4 )

Date of Publication:

Jul 1988

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