Cart (Loading....) | Create Account
Close category search window
 

Subnanosecond pulse generation in the VUV by dual-wavelength pumped stimulated rotational Raman scattering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yamada, T. ; Dept. of Electr. Eng., Keio Univ., Yokohama, Japan ; Nakata, T. ; Kannari, F.

A novel scheme to generate a subnanosecond pulse in VUV spectral region is proposed, by applying a dual-wavelength pumping method in conjunction with polarization switching technique to the stimulated rotational Raman scattering process. Optimum conditions for the efficient conversion and short pulse generation are presented through numerical model calculations. It is theoretically shown that the duration of the first anti-Stokes pulse of a VUV pump laser can be shorten to 0.72 ns. Since the anti-Stokes pulse is generated at a frequency within the gain profile of the pump laser, the proposed process is applicable to a seed pulse generation for subnanosecond pulse amplification by the pump laser medium in the VUV region

Published in:

Quantum Electronics, IEEE Journal of  (Volume:31 ,  Issue: 7 )

Date of Publication:

Jul 1995

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.