Close category search window
 

Field and laboratory studies to assess the state of health of valve-regulated lead acid and other battery technologies using conductance testing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Hlavac, M.J. ; Midtronics Inc., Willowbrook, IL, USA ; Feder, D.O. ; Croda, T.G. ; Champlin, K.S.
more authors

This paper demonstrates the high correlation of capacity and conductance on hundreds of cells in telecommunication, UPS, railroad signalling and other usages. It confirms the premature capacity loss of valve regulated lead acid (VRLA) cells reported previously and provides information on failure modes via post mortem tear-down of some of the defective cells. Further, it extends the correlation of conductance and capacity to flooded lead acid cells and provides preliminary data of capacity conductance correlation with flooded nickel cadmium (Ni-Cd) batteries. It also introduces the results of techniques of noise suppression to allow online conductance measurements to be made on the batteries without interruption while the batteries continue in service

Published in:
Telecommunications Energy Conference, INTELEC '93. 15th International  (Volume:2 )

Date of Conference: 27-30 Sep 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.