Cart (Loading....) | Create Account
Close category search window

High-speed imaging of the pulsed-field flashover of an alumina ceramic in vacuum

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Coaker, B.M. ; Dept. of Electr. & Electron. Eng. & Appl. Phys., Aston Univ., Birmingham, UK ; Xu, N.S. ; Latham, R.V. ; Jones, F.J.

An intensified high-speed imaging technique was used to observe the optical events associated with the pulsed-field breakdown of an alumina ceramic tube having two concentric planar electrodes metalized onto its end face. HV pulses, typically of 5 kV amplitude (5 kV μs -1 rate of rise), were applied to the radial MIM insulator-electrode regime under ultrahigh vacuum (pressure <5×10-7 Pa), with video recordings made at 1000 frames per second. Images of the observed breakdown phenomena are presented, viewed both along the center axis and also in the plane of the MIM structure. These breakdown images are discussed in relation to plasma jets associated with vacuum arcs and, in particular, on the nature of the ion species within such jets

Published in:

Dielectrics and Electrical Insulation, IEEE Transactions on  (Volume:2 ,  Issue: 2 )

Date of Publication:

Apr 1995

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.