By Topic

Tomographic formulation of interferometric SAR for terrain elevation mapping

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Marechal, N. ; Dept. of Radar & Signal Syst., Aerosp. Corp., El Segundo, CA, USA

Topographic mapping with spotlight synthetic aperture radar (SAR) using an interferometric technique is studied. Included is a review of the equations for determination of terrain elevation from the phase difference between a pair of SAR images formed from data collected at two differing imaging geometries. This paper builds upon the systems analysis of Li and Goldstein in which image pair decorrelation as a function of the “baseline” separation between the receiving antennas was first analyzed. In this paper correlation and topographic height error variance models are developed based on a SAR image model derived from a tomographic image formation perspective. The models are general in the sense that they are constructed to analyze the case of single antenna, two-pass interferometry with arbitrary antenna line of sight, and velocity vector directions. Correlation and height error variance sensitivity to SAR system parameters and terrain gradients are studied

Published in:

Geoscience and Remote Sensing, IEEE Transactions on  (Volume:33 ,  Issue: 3 )