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Subpixel edge location in binary images using dithering

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2 Author(s)
Xiangdong Liu ; Dept. of Comput. Sci., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA ; R. W. Ehrich

This paper concerns the problem of obtaining subpixel estimates of the locations of straight edges in binary digital images using dithering. By adding uniformly distributed independent random noise it is shown that estimation bias may be removed and that the estimation variance is inversely proportional to the length of the line segment. The sensitivity to incorrect dither amplitude is calculated, and implementation is discussed

Published in:

IEEE Transactions on Pattern Analysis and Machine Intelligence  (Volume:17 ,  Issue: 6 )