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Synthesis of weighted random sequences with application to testing of sequential circuits

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2 Author(s)
Gloster, C. ; ECE Dept., North Carolina State Univ., Raleigh, NC, USA ; Brglez, F.

The weights are stored and a weighted random sequence generator is used to produce the required test sequences during testing rather than storing the actual test sequence themselves. The generation of required weights is based on the dynamic scan algorithm, DYNASTEE. Experimental results demonstrate tradeoffs in test application time and in tester memory requirements, while maintaining 100% fault coverage of all target faults

Published in:

Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on

Date of Conference:

22-25 Feb 1993

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