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CHAN: An efficient critical path analysis algorithm

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2 Author(s)
Hoon Chang ; Comput. Eng. Res. Center, Univ. of Texas, Austin, TX, USA ; J. A. Abraham

An efficient critical path analysis algorithm (CHAN) based on the automatic test pattern generation (ATPG) method PODEM is presented. The approach does not require generation of the path list and elimination of false paths, and the critical path of the circuit is found accurately. In CHAN, the limitations of conventional approaches are overcome, and the critical path is detected in vastly improved times in most cases considered

Published in:

Design Automation, 1993, with the European Event in ASIC Design. Proceedings. [4th] European Conference on

Date of Conference:

22-25 Feb 1993